NADE Conference 2007

Recently I went to the NADE Conference in Tucson, AZ. It was a week long seminar, with numerous speakers.
Some of the topics discussed were:
Forensic Photography
Print Procees Identification
Art and Artifact Forgery Identification
Decoding Printer information
Forgery Science
ASTM
Paper Analysis
Extreme Grips
Book Smarts

I met a few published document examiners such as Kathie Koppenhaver, Reed Hayes, Marcel Matley, and Dr Brian Found.

What I learned will be invaluable to me in my business of Forensic Document examination.